XRR patterns of Sample No. 1 and No. 2 as a function of glancing angle. For clarity, each pattern is vertically shifted. Dashed-and-dotted line: position of the critical angle for . Inset: FT power spectra of Sample No. 1 and No. 2 as a function of layer thickness.
AFM images of the surfaces in the area of . (a) Sample No. 1. (b) Sample No. 2. Gray scale: height of 3.5 nm for (a), 2.5 nm for (b).
PL (logarithmic scale) and reflectance (linear scale) spectra as a function of photon energy at 10 K. (a) Sample No. 1. (b) Sample No. 2. Dashed line: guide for the eyes.
PL spectra of Sample No. 1 at 10, 30, and 50 K.
Shift of the exciton transition energy at the point, , calculated as a function of biaxial strain. Subscript : band of the hole forming the exciton (, , or ). Index : exciton principal quantum number .
PLE and reflectance spectra as a function of photon energy at 10 K. Detection energy for the PLE spectra: 3.482 eV. (a) and (b) Sample No. 1. (c) and (d) Sample No. 2.
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