1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Characterization of thin films by photoemission spectroscopy
Rent:
Rent this article for
USD
10.1063/1.2775889
/content/aip/journal/jap/102/5/10.1063/1.2775889
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/5/10.1063/1.2775889
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Growth phase diagram of 40-nm-thick thin films in the plane (Ref. 3). Samples indicated by open circles, open squares, and closed triangles were found to be , , and their mixture, respectively.

Image of FIG. 2.
FIG. 2.

(Color online) Photoemission spectra of thin films. (a) and core-level spectra. (b) Comparison of the core-level spectra between a thin film and a bulk sample (Ref. 6) of . (c) core-level spectra. (d) valence-band spectra.

Image of FIG. 3.
FIG. 3.

(Color online) Aging of core-level spectra. (a) and core-level spectra. (b) core-level spectra.

Image of FIG. 4.
FIG. 4.

(Color online) and core-level photoemission spectra of thin films grown under various conditions. (a) ; (b) ; and (c) .

Loading

Article metrics loading...

/content/aip/journal/jap/102/5/10.1063/1.2775889
2007-09-13
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of LaVOx thin films by photoemission spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/5/10.1063/1.2775889
10.1063/1.2775889
SEARCH_EXPAND_ITEM