Normalized plot of transport critical current density in applied magnetic field of an sample on substrate at .
Temperature dependence of values for a control YBCO and samples on substrates.
Angular dependence of values of sample on a substrate at various applied fields of 1, 3, and at .
Normalized with respect to in of samples as compared to regular YBCO at ( substrate and metallic substrate).
Angular dependence of of an film on a buffered metallic Ni–W substrate in an applied magnetic field of at .
Scanning electron micrograph of an sample on a buffered Ni–W metallic substrate.
Cross-sectional TEM image of an sample on a substrate. The particles were identified to be in the selected area diffraction pattern. Nanocolumns extending through the thickness, can be seen clearly, are marked by arrows.
High resolution TEM image of an film showing high density of defects. The FFT filtered image (shown on the right) shows the existence of high density of misfit dislocations and stacking faults at the YBCO∕BSO interfaces.
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