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Modeling of screening effect on remote Coulomb scattering due to gate impurities by nonuniform free carriers in poly-Si gate
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10.1063/1.2785944
/content/aip/journal/jap/102/7/10.1063/1.2785944
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/7/10.1063/1.2785944
/content/aip/journal/jap/102/7/10.1063/1.2785944
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/content/aip/journal/jap/102/7/10.1063/1.2785944
2007-10-02
2014-11-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Modeling of screening effect on remote Coulomb scattering due to gate impurities by nonuniform free carriers in poly-Si gate
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/7/10.1063/1.2785944
10.1063/1.2785944
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