Double parallel-plate capacitor (series) configuration used for permittivity and loss tangent measurements.
XRD pattern of the KNN-LT-LS (a) target (designated as ceramic) and KNN-LT-LS/SRO deposited at and (b) scans of (110) pole of KNN-LT-LS for 600 and deposited films.
RBS composition profiles of the KNN-LT-LS/SRO on STO: (a) and (b) .
Field emission SEM images of cross section of KNN-LT-LS/SRO films, deposited at (a) , (b) , (c) , and (d) . The inset shows the top surface of the KNN-LT-LS films.
Dielectric permittivity and loss tangent of KNN-LT-LS films deposited at . The film thickness is .
Ferroelectric hysteresis loop of the KNN-LT-LS thin films deposited at with thickness.
trace of the KNN-LT-LS thin films deposited at with thickness.
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