XRD patterns of samples doped with different ratios. The samples were sintered at for 1 h. The peaks of indexed, while the peaks of MgO are marked by asterisks.
The temperature dependence of and for undoped and 10% doped samples sintered at . The temperature dependence of for 10% doped and undoped samples measured with Fe sheath were plotted as inset.
properties of undoped and C doped tapes heated at 700 and .
TEM micrographs showing the nanoparticle inclusions and dislocations of the doped samples. The inset displays the selected-area electron diffraction pattern taken from the circular region of 200 nm in diameter.
TEM image (a) and XRD pattern (b) of the starting powder, with a high-resolution TEM micrograph put at the corner of TEM image.
Sample data for tapes made by different sintering temperatures and doping levels.
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