(a) Illustration of a mosaic layer structure with the correlation lengths, tilt, and twist features and the shape of the scattering in reciprocal space are contribution from the microscopic tilt distribution (black ellipse) and lateral correlation length (gray ellipse). (b) A schematic of a reciprocal space map shows the full-width at half-maximum intensity of the overall ellipse is contributed from the lateral finite sizes and the microscopic tilts .
Williamson–Hall plots for MBE- and MOCVD-grown InN films. Triple-axis scans were measured for reflections indicated. The straight lines are linear fitting.
Williamson–Hall plots for MBE and MOCVD-grown InN films. Triple-axis scans were measured for reflections indicated. The straight lines are linear fitting.
The (105) reciprocal space map of MBE-grown InN (a), MBE-grown InN (b). The straight lines are used for measuring the FWHMs of the overall ellipse.
The FWHMs of asymmetric plane as a function of inclination angle. The dashed lines are least-square fits for extrapolating the twist angle.
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