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Chemical structure of the materials investigated in this work: (a) spiro-octo1 (-hexaphenyl--spirobifluorene) and (b) spiro-octo2 [-hexakis(biphenyl-4-yl)--spirobifluorene]. (c) Example of measured and calculated and ellipsometric spectra for a thick film of spiro-octo1 with a surface roughness of on silicon substrate. The inset shows the structure of the investigated samples.
(a) Derived dielectric functions of spiro-octo1 (thin blue line) and spiro-octo2 (thick red line) thin films. The positions of the determined optical band gaps and TL oscillators are indicated by thin blue and thick red bars corresponding to spiro-octo1 and spiro-octo2, respectively. (b) Absorption spectra of spiro-octo1 (concentration of ) and spiro-octo2 measured in dichloromethane. The thickness of the cuvette is .
Summary of the fitting parameters (—optical band gap, —peak transition energy, —amplitude, and —broadening) of the employed Tl functions.
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