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Spirobifluorene molecular films investigated by means of near infrared-vacuum ultraviolet spectroscopic ellipsometry
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10.1063/1.2884582
/content/aip/journal/jap/103/4/10.1063/1.2884582
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/4/10.1063/1.2884582

Figures

Image of FIG. 1.
FIG. 1.

Chemical structure of the materials investigated in this work: (a) spiro-octo1 (-hexaphenyl--spirobifluorene) and (b) spiro-octo2 [-hexakis(biphenyl-4-yl)--spirobifluorene]. (c) Example of measured and calculated and ellipsometric spectra for a thick film of spiro-octo1 with a surface roughness of on silicon substrate. The inset shows the structure of the investigated samples.

Image of FIG. 2.
FIG. 2.

(a) Derived dielectric functions of spiro-octo1 (thin blue line) and spiro-octo2 (thick red line) thin films. The positions of the determined optical band gaps and TL oscillators are indicated by thin blue and thick red bars corresponding to spiro-octo1 and spiro-octo2, respectively. (b) Absorption spectra of spiro-octo1 (concentration of ) and spiro-octo2 measured in dichloromethane. The thickness of the cuvette is .

Tables

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Table I.

Summary of the fitting parameters (—optical band gap, —peak transition energy, —amplitude, and —broadening) of the employed Tl functions.

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/content/aip/journal/jap/103/4/10.1063/1.2884582
2008-02-20
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spirobifluorene molecular films investigated by means of near infrared-vacuum ultraviolet spectroscopic ellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/4/10.1063/1.2884582
10.1063/1.2884582
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