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Stability of trapped charges in sapphires and alumina ceramics: Evaluation by secondary electron emission
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10.1063/1.2891792
/content/aip/journal/jap/103/5/10.1063/1.2891792
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/5/10.1063/1.2891792

Figures

Image of FIG. 1.
FIG. 1.

Schematic view of the secondary electrons and induced current measurements. The secondary electron detector (diameter of ) is positioned at a distance from the sample surface. The samples have a thickness of about and a diameter of .

Image of FIG. 2.
FIG. 2.

Current curves obtained in the grain size sample. (, , , , and ); (a) first injection and (b) second injection after .

Image of FIG. 3.
FIG. 3.

Current curves obtained in the grain size sample. (, , , , and ) (a) first injection and (b) second injection after .

Image of FIG. 4.
FIG. 4.

Variation of SEE yield during two injections (a) and (b) separated by . These curves are deduced from Fig. 2 using Eq. (3).

Image of FIG. 5.
FIG. 5.

Variation of SEE yield during two injections (a) and (b) separated by . These curves are deduced from Fig. 3 using Eq. (3).

Image of FIG. 6.
FIG. 6.

Evolution of with the length of time separating the two successive electron irradiations in PA. (, , , , , and ).

Tables

Generic image for table
Table I.

Composition, in ppm, of the alumina materials. The composition of sapphire RSA was determined by x-ray fluorescence (Ref. 15) and those of sapphire PI-KEM and alumina powders were provided by the manufacturers.

Generic image for table
Table II.

Firing conditions (isothermal sintering temperature with the dwelling time) and sample properties achieved (grain diameter and density) after sintering (Ref. 15).

Generic image for table
Table III.

Recovery parameter (in percent) as a function of temperature for the different samples.

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/content/aip/journal/jap/103/5/10.1063/1.2891792
2008-03-12
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Stability of trapped charges in sapphires and alumina ceramics: Evaluation by secondary electron emission
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/5/10.1063/1.2891792
10.1063/1.2891792
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