X-ray diffraction profile of sample A. Inset: rocking curve of BTO (001) diffraction peak.
The GID profile of sample A taken at the incident angle of 0.3°.
(A) XRR spectra and theoretical simulations of sample A taken at temperatures of (a) , (b) , (c) , (d) , (e) , (f) cooling to , and (g) at (B) vs to enhance the oscillations.
Comparison of EDPs of sample A with temperature: (a) heating process and (b) cooling process.
C and O core level XPS spectra taken at the takeoff angle of 45°.
DSC curves for samples A and B.
The out-of-plane lattice constant evolution of STO [curve (a), left -axis] and BTO [curve (b), right -axis] for sample A measured on heating. The change in slope in curve (b) at about signals the ferroelectric phase transition of BTO.
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