Representative domain-evolution patterns and the corresponding magnetization reversal curves of (a) Co (Ref. 20) and (b) MnAs films (Ref. 27), observed successively on exactly the same area of the sample at the room temperature by means of the MOMM system. Note that simple 180° domain walls exist during magnetization reversal, expected from the uniaxial in-plane magnetic anisotropy in both systems.
Typical domain-evolution patterns of the MnAs film at several temperatures in the temperature range of , observed on exactly the same area of the sample.
(a) Distributions of the Barkhausen avalanche sizes in the Co films with varying thicknesses of 5, 10, 25, and , where the distribution in the Co film was obtained with varying magnification from to (Ref. 20) and (b) distributions of the Barkhausen avalanche sizes of the MnAs film at several temperatures of 20, 25, 30, 32.5, and , where the distribution at each temperature was obtained with varying size of the field of view from (Ref. 27).
The scaling exponent as a function of the sawtooth domain wall angle , where was determined from the domain-evolution patterns in Figs. 1 and 2.
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