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Microstructure and magnetic properties of thin films
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10.1063/1.2832342
/content/aip/journal/jap/103/7/10.1063/1.2832342
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/7/10.1063/1.2832342
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

ratio of the films as a function of Ag underlayer thickness annealed at different temperatures.

Image of FIG. 2.
FIG. 2.

[(a) and (b)] Relationships among the , and thickness of Ag underlayers of films annealed at different temperatures.

Image of FIG. 3.
FIG. 3.

X-ray diffraction patterns of the films annealed at for .

Image of FIG. 4.
FIG. 4.

FEG-TEM images of (a) , (b) , (c) , and (d) films.

Image of FIG. 5.
FIG. 5.

Effect of volume percent on the of films annealed at .

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/content/aip/journal/jap/103/7/10.1063/1.2832342
2008-01-30
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Microstructure and magnetic properties of CoPt-SiNx∕Ag thin films
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/7/10.1063/1.2832342
10.1063/1.2832342
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