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Optical microscope image of the fabricated HTS-type SQUID.
Schematic diagram of the measurement probe unit with a 3D magnetic field coil system.
Schematic circuit diagram for the four-terminal measurement of the SQUID and for the sweeping of the 3D magnetic external field.
(a) The plot of Chip 2 at a constant bias current by sweeping the field perpendicular to the SQUID plane, , using the magnet from at 40, 50, 60, and , respectively. Each applied bias current is shown in the graph. The behavior around 0 (b), 1.2 (c), and (d).
The narrow and bold lines represent the plots of Chip 2 at constant bias currents by sweeping the field parallel and perpendicular to Josephson junction, by and , and by and , in the SQUID plane from 0 to 0.12 and at , respectively. Each applied bias current is shown in the graph. The behavior around of (inset).
Parameters for the fabricated HTS-type SQUIDs.
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