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Spectroscopic ellipsometry studies of GaN films deposited by reactive rf sputtering of GaAs target
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10.1063/1.2903443
/content/aip/journal/jap/103/8/10.1063/1.2903443
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/8/10.1063/1.2903443
/content/aip/journal/jap/103/8/10.1063/1.2903443
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/content/aip/journal/jap/103/8/10.1063/1.2903443
2008-04-25
2014-07-10
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spectroscopic ellipsometry studies of GaN films deposited by reactive rf sputtering of GaAs target
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/8/10.1063/1.2903443
10.1063/1.2903443
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