1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Interfacial structure and defect analysis of nonpolar ZnO films grown on -plane sapphire by molecular beam epitaxy
Rent:
Rent this article for
USD
10.1063/1.2905220
/content/aip/journal/jap/103/8/10.1063/1.2905220
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/8/10.1063/1.2905220

Figures

Image of FIG. 1.
FIG. 1.

PV HRTEM images of samples with different preparations. (a) ion milling at . (b) ion milling at followed by chemical etching with . (c) ion milling with a final step at .

Image of FIG. 2.
FIG. 2.

Experimental [(a) and (b)] and simulated [(c) and (d)] SAED in cross section along [(a) and (c)] and [(b) and (d)] zone axis. Sapphire spot indexation is indicated in black and ZnO spot indexation in gray.

Image of FIG. 3.
FIG. 3.

Schematic representation of the parallel configuration between ZnO and -plane sapphire. ZnO axes are shown in gray and sapphire axes in black. Arrows show the direction in the sapphire surface that we use as a reference: (a) viewed along and , (b) top view of surface atomic layers.

Image of FIG. 4.
FIG. 4.

(a) High-resolution image of the interface along the zone axis. [(b) and (c)] Simulated (top) and experimental CBED pattern along zone axis. The thicknesses of the object are in (b) and in (c).

Image of FIG. 5.
FIG. 5.

Plane-view dark field image at the surface of a ZnO layer with in (a) and in (b).

Image of FIG. 6.
FIG. 6.

Cross-section dark field images with , close to zone axis in (a) and [0001] zone axis in (b). The white arrow in (b) indicates a dislocation half-loop.

Image of FIG. 7.
FIG. 7.

(a) Plane-view high-resolution image of a small BSF. A Burger circuit shows that this BSF corresponds to a dissociated -type dislocation. (b) Fourier-filtered image using (0002) spots of the image in (a). The two additional planes at the PD locations are clearly visible. (c) Fourier-filtered image using spots of the image in (a).

Image of FIG. 8.
FIG. 8.

(a) Plane-view high-resolution image of a small BSF. A Burger circuit shows that this BSF corresponds to a dissociated -type dislocation. (b) Fourier-filtered image using (0002) spots of the image in (a). The two additional planes at the PD locations are clearly visible. (c) Fourier-filtered image using spots of the image in (a). An additional plane is clearly visible at the BSF location.

Tables

Generic image for table
Table I.

Stacking sequences and displacement vectors for BSFs and Burger vectors for PDs in the wurtzite structures, along with their extinction rules.

Generic image for table
Table II.

Densities of BSFs and PDs; average separation (along the [0001] direction) and width in (0002) planes of BSFs.

Loading

Article metrics loading...

/content/aip/journal/jap/103/8/10.1063/1.2905220
2008-04-22
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interfacial structure and defect analysis of nonpolar ZnO films grown on R-plane sapphire by molecular beam epitaxy
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/8/10.1063/1.2905220
10.1063/1.2905220
SEARCH_EXPAND_ITEM