1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Interfacial structure and defect analysis of nonpolar ZnO films grown on -plane sapphire by molecular beam epitaxy
Rent:
Rent this article for
USD
10.1063/1.2905220
/content/aip/journal/jap/103/8/10.1063/1.2905220
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/8/10.1063/1.2905220
/content/aip/journal/jap/103/8/10.1063/1.2905220
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/jap/103/8/10.1063/1.2905220
2008-04-22
2014-08-01
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interfacial structure and defect analysis of nonpolar ZnO films grown on R-plane sapphire by molecular beam epitaxy
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/8/10.1063/1.2905220
10.1063/1.2905220
SEARCH_EXPAND_ITEM