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Determination of buried interface composition and magnetism profiles using standing-wave excited soft x-ray emission and inelastic scattering
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10.1063/1.2906331
/content/aip/journal/jap/103/8/10.1063/1.2906331
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/8/10.1063/1.2906331
/content/aip/journal/jap/103/8/10.1063/1.2906331
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/content/aip/journal/jap/103/8/10.1063/1.2906331
2008-04-18
2014-10-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of buried interface composition and magnetism profiles using standing-wave excited soft x-ray emission and inelastic scattering
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/8/10.1063/1.2906331
10.1063/1.2906331
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