1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
CoCr/Pt multilayers with adjustable perpendicular anisotropy
Rent:
Rent this article for
USD
10.1063/1.2912948
/content/aip/journal/jap/103/9/10.1063/1.2912948
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/9/10.1063/1.2912948
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD patterns of (0.3 nm)/Pt multilayers grown on the Si (111) substrates. The diffraction patterns reveal a fcc multilayer structure. The patterns have been vertically shifted for better presentation.

Image of FIG. 2.
FIG. 2.

XRD patterns of (0.5 nm)/Pt multilayers grown on the Si (100) substrates. The diffraction patterns reveal the good quality of the multilayer structure and a fcc structure. The patterns have been vertically shifted for better presentation.

Image of FIG. 3.
FIG. 3.

Polar Kerr-rotation spectra for three (0.3 nm)/Pt multilayers grown on the Si (111) substrates. The measurements are performed at RT. The enhancement of the Kerr rotation in the UV region is large.

Image of FIG. 4.
FIG. 4.

Polar Kerr hysteresis loops for (0.3 nm)/Pt multilayers with different Pt layer thicknesses. Inset: coercivity values for Pt thickness between 0.4 and 1.6 nm.

Image of FIG. 5.
FIG. 5.

Polar angular dependence of the resonance field of the (0.3 nm)/Pt (1.1 nm) multilayer sample measured at the microwave frequencies of 9.24 GHz (squares) and 34.82 GHz (circles). The solid line is a fit used in determining the magnetic anisotropy fields; the dashed line is only a guide to the eye.

Image of FIG. 6.
FIG. 6.

Polar angular dependence of the resonance field of the (0.3 nm)/Pt (0.4 nm) multilayer sample measured at the microwave frequencies of 9.24 GHz (squares) and 34.82 GHz (circles). The solid lines are fits.

Image of FIG. 7.
FIG. 7.

Polar Kerr-rotation spectra for (0.5 nm)/Pt multilayers grown on the Si (100) substrates at RT. The sample with presents the highest magneto-optic response.

Image of FIG. 8.
FIG. 8.

Comparison of polar Kerr hysteresis loops for (0.5 nm)/Pt multilayers by varying Pt layer thickness.

Image of FIG. 9.
FIG. 9.

Coercivity and squareness values for Pt thickness between 0.6 and 2.1 nm. The solid lines are a guide to the eye.

Image of FIG. 10.
FIG. 10.

Comparison of the polar Kerr-rotation spectra at RT for two similar multilayers grown on the Si (111) substrates with different Cr concentrations: (0.3 nm)/Pt (0.4 nm) and (0.3 nm)/Pt (0.4 nm). The measurements reveal the spectacular decrease in the magnetization with the increase in the Cr composition. In the same diagram, the spectra of the (0.3 nm)/Pt (0.4 nm) multilayer at 10 K and of a 22-nm-thick film are presented for comparison.

Image of FIG. 11.
FIG. 11.

LT XMCD spectra recorded at the edges for the (0.6 nm)/Pt (0.4 nm) sample.

Image of FIG. 12.
FIG. 12.

Hysteresis loop obtained at 10 K via SQUID magnetometry for the (0.3 nm)/Pt (0.4 nm) sample.

Loading

Article metrics loading...

/content/aip/journal/jap/103/9/10.1063/1.2912948
2008-05-06
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: CoCr/Pt multilayers with adjustable perpendicular anisotropy
http://aip.metastore.ingenta.com/content/aip/journal/jap/103/9/10.1063/1.2912948
10.1063/1.2912948
SEARCH_EXPAND_ITEM