High resolution TEM images of (a) and (b) films observed in cross-sectional view. The insets are selected area electron diffraction patterns.
Hysteresis loops of the amorphous films with , 0.52, 0.66, and 0.79 measured at . The inset is the hysteresis loop of the film with , which shows the exchange bias obviously.
The temperature dependence of the magnetization measured at magnetic field for amorphous films with , 0.52, 0.66, and 0.79, respectively.
(a) The temperature dependence of the resistivity of film, (b) the magnetic field dependence of the Hall resistivity measured at 30 and , and (c) the temperature dependence of the Hall resistivity measured at magnetic field.
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