1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Bismuth-induced dielectric relaxation in the perovskite system
Rent:
Rent this article for
USD
10.1063/1.2951890
/content/aip/journal/jap/104/1/10.1063/1.2951890
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/1/10.1063/1.2951890

Figures

Image of FIG. 1.
FIG. 1.

Primitive perovskite unit cell volume in (Ref. 13) and (Refs. 14 and 26) as a function of the Bi content.

Image of FIG. 2.
FIG. 2.

IR reflectivity spectra of the ceramics: experimental data (open symbols) and fit (solid lines).

Image of FIG. 3.
FIG. 3.

Imaginary part of the dielectric function calculated from IR reflectivity data on the system.

Image of FIG. 4.
FIG. 4.

Average weighted sum of the TO phonon dampings as a function of Bi content in .

Image of FIG. 5.
FIG. 5.

Relative permittivity (, top panel) and dielectric loss tangent (, bottom panel) for as a function of : measured at a microwave range (◼), radio frequencies (△), and extrapolated from IR data (∗). The inset shows the compositional variation of estimated from the IR dielectric function.

Image of FIG. 6.
FIG. 6.

Three dimensional maps of the topography (top) and relative permittivity (bottom) for the ceramics with . Changing contrast from dark to bright corresponds to increasing the permittivity value.

Image of FIG. 7.
FIG. 7.

Low-temperature dielectric response of the ceramics at the range of (increasing frequency is denoted by arrows).

Image of FIG. 8.
FIG. 8.

Compositional variation of the peak temperature measured over in .

Image of FIG. 9.
FIG. 9.

Vogel-Fulcher plots for the relaxation in LMT-BMT using Eq. (3).

Image of FIG. 10.
FIG. 10.

Temperature dependences of the dielectric permittivity for the LMT-BMT ceramics (the straight lines represent linear fits). Right panel: the temperature coefficient of capacitance estimated at as a function of Bi content in (Ref. 13).

Image of FIG. 11.
FIG. 11.

Dielectric permittivity of the ceramics at the range of as a function of temperature (Refs. 14, 15, and 26).

Tables

Generic image for table
Table I.

The microwave dielectric properties of the solid solutions based on LMT.

Generic image for table
Table II.

Relative permittivity of the ceramics measured by EMP and conventional microwave resonant cavity method at a gigahertz range.

Generic image for table
Table III.

Parameters of the fit of the data on to Eq. (3): freezing temperature , characteristic frequency , relaxation time , and activation energy .

Loading

Article metrics loading...

/content/aip/journal/jap/104/1/10.1063/1.2951890
2008-07-07
2014-04-24
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Bismuth-induced dielectric relaxation in the (1−x)La(Mg1∕2Ti1∕2)O3–xBi(Mg1∕2Ti1∕2)O3 perovskite system
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/1/10.1063/1.2951890
10.1063/1.2951890
SEARCH_EXPAND_ITEM