Schematic illustration of the layers present in the model structure.
Schematic of the Brazil nut specimen and .
Schematic of load vs displacement plot describing the corresponding tip-sample interaction phenomena (Ref. 17).
Typical force per unit area displacement curve for (a) hertz, (b) JKR, (c) DMT, and (d) actual MD adhesion models regarding contact theory of spheres.
Typical force-displacement curve obtained for parylene C/316L stainless steel adhesion.
A typical force-displacement curve achieved from the Brazil nut experiment for parylene C/316L interface.
Fracture toughness measurements obtained for parylene C/316L interface over a range of mode mixities.
Representative backscattered SEM image of results of a Brazil nut specimen after specimen fractured in Instron. (a) and (d) show the two quadrants on the flat half and (b) and (c) are the two quadrants on the notched half on the Brazil nut.
Mode I fracture toughness of the parylene C/316L interface vs the prediction from the DMT model.
XPS results of EPO-TEK adhesive illustrating the (a) elemental concentrations (normalized to 100% of the elements detected. XPS does not detect H or He) and (b) atomic concentrations of carbon chemical species.
SEM measurements of the radius of the coated AFM tips.
White light interferometry results describing the rms surface roughness of electropolished 316L coupons.
Mechanical properties of materials used in the structure of DES.
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