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Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy
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10.1063/1.3029725
/content/aip/journal/jap/104/10/10.1063/1.3029725
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/10/10.1063/1.3029725
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Experimental setup of X-EFM system and method for detection of x-ray photoionization in this system (inset).

Image of FIG. 2.
FIG. 2.

(a) AFM image of CNTs on substrate and X-EFM images at (b) and (c) .

Image of FIG. 3.
FIG. 3.

(a) AFM and (b) X-EFM images of group A. These images are overlapped in a single frame in (c).

Image of FIG. 4.
FIG. 4.

(a) AFM and (b) X-EFM images of group B. These images are overlapped in a frame in (c).

Image of FIG. 5.
FIG. 5.

(a) AFM and (b) X-EFM profile along a white line indicated in Fig. 4(a).

Image of FIG. 6.
FIG. 6.

(a) Mechanical process for CNT branch formation and (b) probable distribution of electron trapping centers produced by the process.

Image of FIG. 7.
FIG. 7.

(a) AFM and (b) X-EFM images of CNT branch. These images are overlapped in a frame in (c).

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/content/aip/journal/jap/104/10/10.1063/1.3029725
2008-11-25
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Imaging of charge trapping in distorted carbon nanotubes by x-ray excited scanning probe microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/10/10.1063/1.3029725
10.1063/1.3029725
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