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Ohmic contact probed by dark injection space-charge-limited current measurements
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10.1063/1.3043880
/content/aip/journal/jap/104/12/10.1063/1.3043880
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/12/10.1063/1.3043880
/content/aip/journal/jap/104/12/10.1063/1.3043880
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/content/aip/journal/jap/104/12/10.1063/1.3043880
2008-12-17
2014-09-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ohmic contact probed by dark injection space-charge-limited current measurements
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/12/10.1063/1.3043880
10.1063/1.3043880
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