(a) Grazing angle x-ray diffraction of LT thin film and (b) AFM image of monolayer LT thin film with a thickness of 400 nm deposited on Pt–Si .
PL excitation spectra with the detector fixed at (1) 4.71 eV and at (2) 4.42 eV.
(a) PL spectra (unpolarized) of polycrystalline LT thin film at room temperature. For curves 1 and 2 incident wavelengths are 240 and 235 nm, respectively. (b) PL spectra with the -axis as shift energy with respect to the incident energy.
Raman spectra of the polycrystalline LT thin film.
Band gap PL spectra with superimposed peaks of polycrystalline LT thin film at room temperature for incident wavelength of 240 nm at different angles of incidence.
(a) Position of O–H fundamental stretching mode (near ) and its third harmonic (near ) as a function of excitation wavelength. (b) Dispersion of the fundamental and its third harmonic of the stretching mode of O–H in LT thin film.
Observed and reported wave numbers of the peak position due to O–H /O–D vibration, libration, and combination of modes.
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