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The conductivity of Bi(111) investigated with nanoscale four point probes
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10.1063/1.2969769
/content/aip/journal/jap/104/5/10.1063/1.2969769
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/5/10.1063/1.2969769
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The measured four point resistance vs the effective contact spacing. The solid blue line indicates the expected resistance for bulk Bi (using after Ref. 29) A picture of the probe and an curve (measured using a contact spacing of 500 nm) are shown in the insets.

Image of FIG. 2.
FIG. 2.

The measured four point resistance (corrected and incorporating the surface sensitivity) plotted against the relative sensitivity . The solid line indicates the expected behavior for a bulk dominated measurement. The black dashed lines indicate the expected behavior for the combined bulk and surface terms (using surface resistivities of 0.1, 1, and ).

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/content/aip/journal/jap/104/5/10.1063/1.2969769
2008-09-10
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The conductivity of Bi(111) investigated with nanoscale four point probes
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/5/10.1063/1.2969769
10.1063/1.2969769
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