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Evaluation of the strains in charge-ordered thin films using Raman spectroscopy
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10.1063/1.2978207
/content/aip/journal/jap/104/6/10.1063/1.2978207
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/6/10.1063/1.2978207

Figures

Image of FIG. 1.
FIG. 1.

Typical Raman spectra of the thin film at the temperature range of 78–295 K obtained from the film surface.

Image of FIG. 2.
FIG. 2.

Typical Raman spectra of the thin film at the temperature range of 78–295 K obtained from the film surface.

Image of FIG. 3.
FIG. 3.

Polarized Raman spectra measured on the (a) PCMO/LAO and the (b) PCMO/STO films at 78 K. The scattering configuration for each spectrum is indicated, where the first (second) symbol defines the polarization of the incident (scattered) light. In the case of the PCMO/LAO film, there is a mixture of polarizations as indicated by the parenthesis. In order to present better the low frequency region of the PCMO/LAO film, it has been multiplied by a factor of 2.5.

Image of FIG. 4.
FIG. 4.

Schematic representation of the cross section Raman scanning at 0 nm (a), 300 nm (b), and 500 nm (c) depth. Circles represent the laser beam, and the center of the circles the laser central position. The thin film and the film-substrate interface are also shown.

Image of FIG. 5.
FIG. 5.

Raman spectra obtained from the cleaved cross section (the face perpendicular to the film surface) of the film. (a) shows the as-recorded spectra and (b) the ones after subtraction. The bold gray spectrum of (b) is the spectrum of thin film obtained from the film surface.

Image of FIG. 6.
FIG. 6.

Temperature dependence of the mode frequency for (a) and (b) . Squares mark the Raman results of thin films on STO and triangles on LAO substrate. Dashed lines indicate changes in the temperature dependence of the data points. In addition the transition temperatures of the bulk are shown for comparison (, for , and , for ).

Image of FIG. 7.
FIG. 7.

Strain distribution across the [101] direction vs depth for the thin films. The thin film and the film-substrate interface are also shown, as in Fig. 4 for comparison.

Image of FIG. 8.
FIG. 8.

Film thickness dependence of the Raman spectra of the PCMO thin films grown on LAO [(a) and (c)] and STO [(b) and (d)] substrate. (a) and (b) show the as-recorded spectra and (c), and (d) the ones after subtraction.

Tables

Generic image for table
Table I.

The proposed assignment for all observed modes of the film.

Generic image for table
Table II.

Observed and estimated phonon frequency using Eq. (1) for the bands. stands for present data.

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/content/aip/journal/jap/104/6/10.1063/1.2978207
2008-09-18
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Evaluation of the strains in charge-ordered Pr1−xCaxMnO3 thin films using Raman spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/6/10.1063/1.2978207
10.1063/1.2978207
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