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Ferroelectric stripe domains in thin films: Depolarization field and domain randomness
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10.1063/1.2978225
/content/aip/journal/jap/104/6/10.1063/1.2978225
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/6/10.1063/1.2978225
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

XRD diffractograms of a 60 unit cell thick film of at low-angle (a), and around the (001) (b) and (002) (c) Bragg reflections, respectively. (d) and (e) show phi scans of the (101) reflections for and , respectively.

Image of FIG. 2.
FIG. 2.

Reciprocal space map of the (103) Bragg reflection for a 80 nm thick film of .

Image of FIG. 3.
FIG. 3.

AFM images of a 14 unit cell (a) and a 105 unit cell (b) thick film of . (c) shows a plane-view TEM image of a 27 unit cell thick film of .

Image of FIG. 4.
FIG. 4.

A typical ferroelectric hysteresis loop (a) and displacement current vs electric field (b) for a 100 nm thick film of .

Image of FIG. 5.
FIG. 5.

High-resolution linear profiles recorded for the (001), (003), (103), and (303) reflections of a 58 unit cell thick film of .

Image of FIG. 6.
FIG. 6.

(a) 2D FFT of an AFM image equivalent to that displayed in the inset of Fig. 3(a). (b) profile of this 2D FFT, fitted by Voigt functions. (c) Film thickness dependence of the in-plane surface modulation. (d) Film thickness dependence of the XRD intensities of corresponding Bragg and satellite peaks.

Image of FIG. 7.
FIG. 7.

(a) Schematic illustration of the ferroelectric stripe domains. (b) Simulated profile intensities for domain size ratios from 10% up to 90% up.

Image of FIG. 8.
FIG. 8.

The dependence of the diffuse scattering peaks on for a 27 unit cell thick film of , recorded around the (001) reflection.

Image of FIG. 9.
FIG. 9.

(a) In-plane x-ray scattering profiles for 16, 42, 72, and 94 unit cell thick films of . (b) Film thickness dependence of the mean stripe width for grown on and substrates, respectively.

Image of FIG. 10.
FIG. 10.

Depolarization field dependence of the stripe width for the ferroelectric stripe domain ground state.

Image of FIG. 11.
FIG. 11.

High-resolution linear profiles of (a) and (b), recorded immediately after growth and again after 1 year of storage in air.

Image of FIG. 12.
FIG. 12.

(a) Map of simulated profiles vs random variations in stripe width for an idéal 50:50 vs stripe domain state. (b) Corresponding line profiles for 0%, 25%, 50%, 75%, and 100% random variation in stripe width.

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/content/aip/journal/jap/104/6/10.1063/1.2978225
2008-09-22
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ferroelectric stripe domains in PbTiO3 thin films: Depolarization field and domain randomness
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/6/10.1063/1.2978225
10.1063/1.2978225
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