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Experimental off-axis electron holography of focused ion beam-prepared Si junctions with different dopant concentrations
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10.1063/1.2982415
/content/aip/journal/jap/104/6/10.1063/1.2982415
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/6/10.1063/1.2982415
/content/aip/journal/jap/104/6/10.1063/1.2982415
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/content/aip/journal/jap/104/6/10.1063/1.2982415
2008-09-26
2014-08-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental off-axis electron holography of focused ion beam-prepared Si p-n junctions with different dopant concentrations
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/6/10.1063/1.2982415
10.1063/1.2982415
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