Raman spectra are shown from (a) the SL layer and (b) the cladding in the as-grown sample, and from (c) the SL layer in the intermixed sample.
Raman spectra on the IFVD intermixed SL samples annealed at .
PL peak position at the center of the SL vs annealing temperature.
Raman spectral features with clear trends vs. annealing temperature.
The shifts of (a) the GaAs-like TO peak position and (b) the GaAs-IF mode vs. the TE polarized PL wavelength, and (c) the intensity ratio of the GaAs-like alloy and bulk-like modes.
Profiles along the bandgap grating at the SL core layer are shown, revealing the (a) GaAs-like TO mode position, (b) GaAs-like TO mode integrated area, (c) GaAs-like IF TO mode integrated area, (d) PL peak position, (e) AlAs-TO FWHM, and (f) the AlAs-like DA/IF mode integrated area.
The SL core samples.
Observed Raman peaks for the SL core samples.
Raman spectral parameters
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