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X-ray diffraction study of the damage induced in yttria-stabilized zirconia by swift heavy ion irradiations
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10.1063/1.2986280
/content/aip/journal/jap/104/7/10.1063/1.2986280
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/7/10.1063/1.2986280

Figures

Image of FIG. 1.
FIG. 1.

Electronic stopping power (solid lines, left scale) and nuclear-collision damage profile (dashed lines, right scale) vs depth computed with the TRIM96 code simulations (Ref. 17) for 180-MeV S, 200-MeV Ni, 200-MeV I, and 200-MeV Au ion irradiations (including recoil contributions) in YSZ samples. The penetration depths of radiation in powdered samples for the (200), (220), (400), (440), and (600) reflections (Table II) are marked by vertical lines.

Image of FIG. 2.
FIG. 2.

X-ray rocking curves ( scans) of the (200) reflection of R YSZ (100) single crystals irradiated with 100-MeV C ions at fluences of , , and . The curve labeled “Ref (200)” corresponds to a pristine sample. The dashed lines are least-squares fits to a pseudo-Voigt profile for the reference crystal and the sample irradiated at and Gaussian profiles for the samples irradiated at and . Offsets due to miscut angles have been kept so as to avoid peak overlap.

Image of FIG. 3.
FIG. 3.

X-ray rocking curves ( scans) of the (220) reflection of an AR YSZ (110) single crystal irradiated with 200-MeV Au ions at a fluence of (a), of the (200) reflection of a R YSZ (100) single crystal (b), and of the (400) reflection of a R YSZ (100) single crystal (c) irradiated with 2.6-GeV U ions at . The lines are least-squares fits to pseudo-Voigt profiles.

Image of FIG. 4.
FIG. 4.

X-ray rocking curves ( scans) of the (200) reflections of an AR YSZ (100) single crystal irradiated with 200-MeV Au ions at a fluence of (a) and of a R YSZ (100) single crystal irradiated with 200-MeV I ions at and annealed for 30 min in air at (b). The curve labeled “Ref (200)” corresponds to a pristine sample. The dashed lines are least-squares fits to pseudo-Voigt profiles for the reference crystal and the annealed sample and to a Gaussian profile for the as-irradiated sample at . Offsets due to miscut angles have been kept so as to avoid peak overlap.

Image of FIG. 5.
FIG. 5.

Reciprocal space mapping around the (220) (a) and (440) (c) reflections of an AR YSZ (110) single crystal irradiated with 200-MeV Au ions at a fluence of , with the corresponding scans (for ) [(b) and (d)].

Image of FIG. 6.
FIG. 6.

scans (with the radiation) of an AR YSZ (110) single crystal irradiated with 200-MeV Au ions at a fluence of (a) and of a R YSZ (100) single crystal irradiated with 2.6-GeV U ions at (b).

Image of FIG. 7.
FIG. 7.

FWHMs of the (200) and (220) Bragg peaks in the rocking curves ( scans) of ion irradiated YSZ (100) or (110) single crystals (AR: as received; R: reduced, vacuum annealed) vs fluence. The solid line is a least-squares fitting of the C ion data with an exponential saturation law according to Eq. (1).

Image of FIG. 8.
FIG. 8.

FWHMs of the (200) and (220) Bragg peaks in the rocking curves ( scans) of ion irradiated YSZ (100) or (110) single crystals (AR: as received; R: reduced, vacuum annealed) vs the average concentration of -type centers measured by EPR spectroscopy (Refs. 4 and 7). The solid lines are linear least-squares regressions of the C, S, and Ni ion data.

Image of FIG. 9.
FIG. 9.

Williamson–Hall plot derived from the scans of ion irradiated YSZ (100) or (110) single crystals (AR: as received; R: reduced, vacuum annealed). The solid lines are linear least-squares regressions of the Au and U ion data (with ). The dashed line is a linear least-squares regression for the data (with ) of I ion irradiated sample (upon annealing at ) passing through the origin.

Tables

Generic image for table
Table I.

Data on ion irradiated YSZ (100) and (110) single crystals (AR: as received; : reduced, vacuum annealed) : , mean longitudinal projected range; , electronic stopping power at the incident energy ; and , average electronic stopping power over the mean penetration depths (Table II) for the reflections, computed with the TRIM96 code simulations (Ref. 17).

Generic image for table
Table II.

Mean penetration depths of radiation in powdered YSZ samples at 90% intensity attenuation of the various reflections with the corresponding Bragg angle .

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/content/aip/journal/jap/104/7/10.1063/1.2986280
2008-10-01
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: X-ray diffraction study of the damage induced in yttria-stabilized zirconia by swift heavy ion irradiations
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/7/10.1063/1.2986280
10.1063/1.2986280
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