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Micron-scale measurements of the coefficient of thermal expansion by time-domain probe beam deflection
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10.1063/1.2988111
/content/aip/journal/jap/104/7/10.1063/1.2988111
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/7/10.1063/1.2988111
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Schematic diagram of the cross section of the experimental geometry of TD-PBD. and are axes of the cylindrical coordinate system. The pump beam heats the surface of the sample; thermal expansion and elastic deformation of the sample produce small deflections of the probe beam, , that are measured by a split photodiode and lock-in detection.

Image of FIG. 2.
FIG. 2.

(a) TD-PBD data measured from , Al∕Invar alloy, , and samples. Solid lines are the best fit calculated using the thermal model with CTE of the , Invar alloy, Rh, and Zn as the only free parameter. (b) Comparison of the CTE measured by TD-PBD with accepted values for selected materials.

Image of FIG. 3.
FIG. 3.

(a) Ni composition profile (open circles) and profile (solid circles) of a Fe–Ni diffusion couple. (b) The compositional dependence of obtained from (a) is compared to data measured by Guillaume (open circles) (see Ref. 17).

Image of FIG. 4.
FIG. 4.

Normalized as a function of delay time showing peaks at for enamel and for dentin generated by the propagation of SAWs. Solid diamonds and circles are experimental data on enamel and dentin, respectively. The solid and dashed lines are fit using the thermal model with for enamel and for dentin, respectively.

Image of FIG. 5.
FIG. 5.

(a) Scanning electron microscopy (SEM) image of the cross section of a human tooth. The material on the left in dentin and that on the right is enamel. (b) Profile of thermal conductivity measured using TDTR along the dashed line in (a). (c) Profile of Young’s modulus measured using TD-PBD along the dashed line in (a). (d) Profile of the CTE measured using TD-PBD along the dashed line in (a).

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/content/aip/journal/jap/104/7/10.1063/1.2988111
2008-10-02
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Micron-scale measurements of the coefficient of thermal expansion by time-domain probe beam deflection
http://aip.metastore.ingenta.com/content/aip/journal/jap/104/7/10.1063/1.2988111
10.1063/1.2988111
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