(a) Scanning electron microscope image of the island-type nanostructure of isolated hard magnetic particles with out-of-plane texture. The sample has been prepared by cosputtering Fe and Pt on MgO (100) heated to . (b) Cross-sectional transmission electron microscope image of the island-type nanostructure shown in (a) covered by a 3 nm Fe layer deposited at RT and a 3 nm Pt protection layer (sample L1). The inset shows the interface in high resolution.
RT out-of-plane and in-plane hysteresis loops of the (5 nm)/Fe (3 nm) ledge-type nanocomposite shown in Fig. 1(b) (sample L1).
RT out-of-plane hysteresis loops of the (5 nm)/Fe (3 nm) ledge-type nanocomposite shown in Fig. 1(b) (sample L1) where part of the Fe film (1 nm) has been deposited at varying elevated temperatures to enable interdiffusion with in forming a graded interface (samples L2a–L2c). The remaining part of the Fe film (2 nm) has been deposited at RT.
RT out-of-plane hysteresis loops of the (5 nm)/Fe (3 nm) ledge-type nanocomposite shown in Fig. 1(b) (sample L1) where part of the Fe film [1 nm (sample L2b) and 2 nm (sample L3), respectively] has been deposited at to produce a graded interface of varying thickness between the hard and soft magnetic parts. The remaining part of the Fe film (2 and 1 nm, respectively) has been deposited at RT.
Cross-sectional high-resolution transmission electron microscope images of bilayers composed of a continuous film (thickness 20 nm) grown on MgO (100) substrates heated to , a continuous Fe film (5 nm) and a Pt protection layer (3 nm). (a) Deposition of the whole Fe film at RT (sharp interface—sample B1). (b) Deposition of part of the Fe film (3 nm) at before sputtering the remaining part (2 nm) at RT (graded interface—sample B2).
Fe content across the bilayers in Fig. 5 with sharp (sample B1) and graded (sample B2) interfaces between the hard magnetic and soft magnetic materials measured by EELS. The intensity of the edge is plotted as a function of the distance from the MgO (100) substrate. As guide for the eyes the occurring layers are sketched.
List of the investigated samples. The parameter denotes the nominal thickness.
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