Surface morphology of a pristine FSZ film (13A) deposited at 673 K.
Surface morphology of an initially polycrystalline FSZ film after irradiation with uranium ions of fluence (a) (sample 13L), (b) (sample 13H), and (d) (sample 13VH). In (c), AFM topography image of the same film, as in (b) (rms roughness, 0.5–0.6 nm, is evaluated along the traced lines).
Surface morphology of initially amorphous FSZ film after irradiation with uranium ions of fluence (a) (15L), (b) (15H), and (c) (sample 15VH).
GIXRD at incidence angle for as-deposited films and for samples irradiated at different fluences (, , , ). Sample series 15 was deposited at RT and had initially an amorphous structure. Sample series 13 was deposited at and had initially a crystalline structure. For comparison, the diffraction pattern of FSZ powder standard from ICSD file #280134 (from Ref. 19) is also shown.
XPS spectra of the Zr , Y , and O core levels for as-deposited and irradiated samples (see also Table I).
Sample parameters of yttria FSZ films before and after being exposed to 2.6 GeV uranium ions ( deposited, fluence, fluence, fluence, and high fluence) including deposition temperature, irradiation fluence, structure according to GIXRD, and relative concentration of Zr, Y, and O as well as Zr/Y and Zr/O ratios deduced from XPS measurements.
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