Absorption spectra and SEM images of as-prepared sample. (1): Absorption spectra of sample before (a) and after (b) Au sputtering, and after (c) annealing at without electric field. (2) and (3): The locally selected SEM images of samples (b) and (c), respectively.
The mapped absorption spectra (1) and the SEM images (2)–(7) of different areas on the surface of Au-sputtered glass after EFAD process (a).
(a) Absorption spectra of the five different areas, as indicated in Fig. 2. The comparison plots for SPR absorption peak position (b) and absorbance (c) among these spectra.
The mapped absorption spectra (1) and the SEM images (2)–(4) of different areas on the surface of sample after EFAD process (b).
The curves during the EFAD process (a) and process (b). Applied voltages are increased in steplike feature as shown in the upper inset plots in both (1) and (2). Evolution plots of decaying duration vs applied voltage are shown as the nether inset in both (1) and (2).
A selected current evolution cycle inset with the schematic image of three current conduction processes (I, II, and III), where denotes Au ions, denotes ejected electrons from Au particles, denotes electrons from the cathode, and is the electric field.
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