The SEM images of the top view of the ZnO nanorods grown on the substrate. The inset shows the ZnO array can be selectively grown on the prepatterned sputtered seed layer.
XRD patterns of (a) the as-grown ZnO nanorods and (b) the ZnO nanorods annealed in air for 30 min.
characteristics of the as-grown and annealed ZnO nanorods/ heterojunction. The inset shows the schematic diagram of the device and measurement method.
Log-log plots of the current-voltage under forward bias of (a) the as-grown sample and (b) the sample annealed in air. The inset in (a) shows the corresponding semilog plot and the inset in (b) shows the energy band diagram of the heterojunction at zero bias.
Room-temperature PL spectra of the as-grown ZnO nanorods and the sample annealed in air.
O peak of the XPS spectra of the obtained ZnO nanorods of (a) the as-grown sample and (b) the sample annealed in air for 30 min (circle: experimental data; red, green and blue line: fitting curves).
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