(a) curves measured from a series of LCMO/NGO(001) films with different film thicknesses and postannealed at different temperatures as denoted. Top right: a schematic of the orthorhombic LCMO films (green) grown on orthorhombic NGO(001) substrates (purple) with their in-plane lattice constants denoted. (b) curves from the 8 nm films annealed at 500, 600, 650, and . (c) Phase diagram of LCMO/NGO(001) films in the plane of film thickness and annealing temperature.
curves measured from the 8 nm films annealed at (a) 600, (b) 650, and (c) under various magnetic fields with the MR shown correspondingly in (d)–(f).
(a) curves measured under various magnetic fields from the film 20 nm thick and annealed at , and the corresponding MR denoted by and is shown in (b) and (c), respectively.
(a) curves measured from the films at 24 nm and annealed at and at 20 nm annealed at . In (b) and (c), ESR spectra from the two samples were measured at 300–110 K.
(a) XRD linear scans around the (002) reflections from the 20 nm films as-grown (green) and annealed at (red). In (b) and (c), the surface of the same samples was imaged using AFM with the scan area of .
curves measured from the films 10–20 nm thick and annealed at with the Ca doped at (a) 0.30, (b) 0.37, and (c) 0.45. Correspondingly in (d)–(f), curves from some typical films are measured under various magnetic fields.
Article metrics loading...
Full text loading...