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Failure mechanism analysis of electromigration dominated damage in nanowires
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10.1063/1.3151965
/content/aip/journal/jap/105/12/10.1063/1.3151965
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/12/10.1063/1.3151965
/content/aip/journal/jap/105/12/10.1063/1.3151965
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/content/aip/journal/jap/105/12/10.1063/1.3151965
2009-06-19
2014-10-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Failure mechanism analysis of electromigration dominated damage in TiSi2 nanowires
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/12/10.1063/1.3151965
10.1063/1.3151965
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