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Morphology image of an individual nanowire and EF-TEM elemental distribution images corresponding to O–K, Si–K, and Ti-L23, presenting the element distribution profile of the nanocable.
A characteristic current-voltage measurement curve. The inset is the resistance variation of each measurement point, which is the ratio between the value of resistance on each measurement point and the initial resistance value.
SEM image and EDS element mapping results. The diffusion of Pt into the nanowire from the electrode is verified.
The migration of Ti. (a) The SEM image. (b) The EDS element mapping result of Ti. (c) The SEM image with an arrow showing the route of the EDS line scan. (d) The EDS line scan results, both Ti and Pt migrated.
The temperature distribution simulation results on a current carrying nanowire.
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