(a) Structure of the thermostable multilayer resist [Al (10 nm)/PES (1000 nm)/Ge (50 nm)/PMMA (200 nm)]. (b) Scheme of the sample with width and length .
Differential conductance of an SN junction for different magnetic fields. The inset shows the thermal dependence of the resistance of the sample.
TEM picture of an In/2DEG contact: no macroscopic diffusion of In occurs.
characteristic of a short SNS junction short-circuited by In filaments at 100mK. The arrows indicate the sense of sweeping of the current sweep.
Article metrics loading...
Full text loading...