Diffractograms for the WC/ films as a function of the SPR.
Total atomic percentages of W, C, and O estimated by XPS vs the SPR.
(a) Real and (b) imaginary parts of the dielectric function of WC/ films.
Refraction and extinction coefficients as a function of the carbon in the WC/ films.
(a) Room temperature electrical resistivity of WC/ thin films vs carbon and literature values of WC (Ref. 15) and (Ref. 38). (b) Electrical resistivity vs temperature . The solid lines are the best fit with the grain-boundary model.
Elastic scattering free path , grain size , and transmission probability as a function of the carbon atomic concentration.
Total elemental chemical composition and distribution in W–C and phases for the WC/ films.
Typical parameters obtained for the best fit of the electrical resistivity of WC/ films with the grain boundary scattering model.
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