Schematic of imaging pump-probe measurement system with 267 nm pump. M is a dielectric mirror, pl is a thin film polarizer, and is a half wave plate.
Reflectivity of the liquid Si surface as a function of the liquid Si thickness.
LSM images of the processed Si surface by a single shot of 267 nm femtosecond laser irradiation. is a polarization of laser.
Cross sectional TEM images of the center of processed area with single pulse irradiation.
Cross sectional TEM images of the (a) center and the (b) edge of the processed area with single pulse irradiation.
Variation in the amorphized area size as a function of the laser peak fluence.
Temporal change in the reflective images in the processed area after single shot laser irradiation. Peak fluence of the pump laser pulse was .
Variation in the reflectivity in the center of the processed area in Fig. 7.
Refractive index of the native oxide, liquid Si, and for 800 nm.
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