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The RT magnetic hysteresis loops for the samples with different . The inset shows the XRD results for the samples with different .
The temperature dependence of resistivity for the different samples and the fittings given by .
The schematic diagram of the bound polarons with exaggerated defect density. is the localization length of a single polaron. is the effective localization length of the overlapping polarons. is the critical length of the contributing microconductivity impact.
The real part of electrical conductivity vs frequency measured at RT for the different samples.
The parameters for different samples obtained by the fittings of Eq. (1).
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