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(a) Chemical structure of . (b) curves taken at , 120, and 290 K for a junction. (c) Magnetotransport data at with . (d) Bias dependence of MR taken at and 120 K. The maximum observed MR is 9.5% at and 5.7% at .
(a) Chemical structure of CuPc. (b) curves at and 290 K for a CuPc-based device. (c) Magnetotransport data taken at with . (d) Bias dependence of MR at , 80, and 120 K. Maximum MRs are 6.4%, 3.2%, and 1.8% at these three temperatures, respectively.
Temperature dependence of maximum observed MR for two junctions based on and CuPc, respectively. The MRs for each sample are normalized to their values at .
[(a) and (c)] Chemical structures of PTCDA and . [(b) and (d)] Magnetotransport data taken at for junctions based on PTCDA and , respectively.
[(a)–(c)] AFM images of , CuPc, and PTCDA films on top of 25 nm Fe layers, respectively. The images were scanned over areas via tapping mode. The PTCDA film has a much rougher surface than the and CuPc films.
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