Dependence of on ECL thickness.
(a) Residual TAA as function of the dc erasure write current with two different erasure durations: one revolution and 64 revolutions. The residual TAA is normalized by the original TAA value before dc erasure. (b) Dynamic coercivity at various levels of magnetization as function of the dc erasure duration. Solids dots are experimental data and dashed lines are fitting of Eq. (2) to data. In both (a) and (b), the ECL thickness is 5.1 Å.
Normalized magnetization as function of dc erasure current for two media with different ECL thicknesses and a medium with oxide layer only. The duration of dc erasure is one revolution. The linear density of the square wave pattern is 116 KFCI (kilo flux changes per inch). Low frequency signal is used to reduce the effect of fly height fluctuation.
Coefficient , defined in Eq. (2), as function of ECL thickness at various magnetization levels. Length of the error bars is the standard error of the least squares curve fitting.
OW and MCW as functions of ECL thickness. OW is measured using a 133 KFCI square wave pattern overwriting a 1000 KFCI pattern. MCW is measured at 133 KFCI with a triple track method (Ref. 7).
Media SNR of a square wave pattern of 670 KFCI. The signal is the amplitude of the fundamental harmonic. The noise is the root-mean-square (rms) amplitude of the integrated media noise power over the bandwidth. Inset: signal and noise have different dependence on ECL thickness.
Media SNR (670 KFCI) as function of MCW. The gray circle is the medium with oxide layer only (no cap layer). The numbers next to the solid circles are the corresponding ECL thickness in Å.
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