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Analysis of the proximity effect and the interface transparency with perpendicular current in Ni/Nb system
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10.1063/1.3073657
/content/aip/journal/jap/105/7/10.1063/1.3073657
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/7/10.1063/1.3073657
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

The superconducting critical temperatures for Ni/Nb/Ni trilayers as a function of . The solid line is obtained from the theoretical fitting with parameters of and . Inset: Thickness dependence of the low-temperature resistivity as a function of the single Ni layer fitted by the Fuchs–Sondheimer relation.

Image of FIG. 2.
FIG. 2.

Unit area resistance, , vs bilayer number measured at 4.2 K. The two sets of samples have Nb thicknesses fixed at 12 and 108 nm, respectively. The solid lines are global fits for four parameters to the data. Inset: The top view geometry of the CPP configuration. Sample is sandwiched between the two circular Nb electrodes. The top and bottom Nb strips are used for the four-point measurement.

Image of FIG. 3.
FIG. 3.

Unit area resistance, , vs Ni thickness with Nb thickness fixed at 27 nm and measured at 4.2 K. The dashed line is linear least-squares fit. The solid line is global fit for four parameters to the data.

Image of FIG. 4.
FIG. 4.

Unit area resistance, , vs Nb thickness with Ni thickness fixed at 78 nm and measured at 4.2 K. The dashed line is linear least-squares fit. The solid line is global fit for four parameters to the data.

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/content/aip/journal/jap/105/7/10.1063/1.3073657
2009-03-11
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of the proximity effect and the interface transparency with perpendicular current in Ni/Nb system
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/7/10.1063/1.3073657
10.1063/1.3073657
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