1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Ferromagnetic resonance properties and anisotropy of Ni-Mn-Ga thin films of different thicknesses deposited on Si substrate
Rent:
Rent this article for
USD
10.1063/1.3075395
/content/aip/journal/jap/105/7/10.1063/1.3075395
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/7/10.1063/1.3075395
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Dependence of the field of maximum resonance absorption on the angle between the film normal and magnetic field direction for different film thicknesses: (○), (◻), (△), and (▼). The lines drawn through the data are results of modeling. Inset: dependence of the field of maximum resonance absorption at (x) and on the film thickness.

Image of FIG. 2.
FIG. 2.

Dependence of resonance linewidth on the angle between the film normal and magnetic field direction for different film thicknesses: (○), (◻), (△), and (▼). A qualitative behavior of resonance linewidth as a function of obtained from modeling for such types of films is shown on the inset.

Image of FIG. 3.
FIG. 3.

Schematic of the thin film with oblique magnetic anisotropy (OA) in a spherical coordinate system. is magnetization vector and is external magnetic field.

Loading

Article metrics loading...

/content/aip/journal/jap/105/7/10.1063/1.3075395
2009-03-27
2014-04-16
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ferromagnetic resonance properties and anisotropy of Ni-Mn-Ga thin films of different thicknesses deposited on Si substrate
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/7/10.1063/1.3075395
10.1063/1.3075395
SEARCH_EXPAND_ITEM