(a) Reference XAS spectra for the two common oxides of europium used to identify the relative presence of the two oxides. (b) X-ray absorption spectra for a 20 Å EuO sample grown Si in the antialigned (solid) and aligned (dashed) configurations at the edge . (c) The corrected XMCD signal at 18 K (corrections described in text).
Moment of different thicknesses of EuO films from 10 to 60 Å measured by SQUID magnetometry plotted against reduced temperature. The curves for all thicknesses follow the same trend indicating the quality and consistent magnetic property of the individual EuO films.
Fraction of EuO for the Al capped (open circle) and Y capped (open square) and the corrected XMCD intensity for yttrium capped EuO wedge. The measured XMCD, averaging at 52.3(±4.2)%, is in close agreement with theoretically expected value (shown by the dashed line) for ultrathin EuO films.
Correction factors used to determine the XMCD value for different thicknesses of the EuO stair-step sample. Details of the analysis are described in text.
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