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Electrical characterization and modeling of the structures with high-quality tunnel-thin fluoride layer
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10.1063/1.3110066
/content/aip/journal/jap/105/8/10.1063/1.3110066
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/8/10.1063/1.3110066
/content/aip/journal/jap/105/8/10.1063/1.3110066
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/content/aip/journal/jap/105/8/10.1063/1.3110066
2009-04-23
2014-09-03
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electrical characterization and modeling of the Au/CaF2/nSi(111) structures with high-quality tunnel-thin fluoride layer
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/8/10.1063/1.3110066
10.1063/1.3110066
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