Boundary conditions at the borders of simulation domain (marked with rectangles): (a) periodic symmetric configuration, (b) general periodic configuration, and (c) open region configuration-bounded system.
Schematic view of the analyzed grating structure with a film aluminum layer (100 nm) on top of the polycarbonate substrate (left) and the actual Al surface morphology detected by AFM (right).
Measured and simulated total reflectance of the aluminum grating structure with and . A simulation of a flat structure (without grating) is shown in addition.
Simulated short-circuit current densities of cell with sinusoidal periodic texture applied to all interfaces. The effect of changing the period and height of grating structure is shown in comparison to a solar cell with flat interfaces. Simulated points are presented by symbols, where lines are added as a guide for the eyes.
Simulated QE of the cell with two different combinations of the grating parameters. Simulation of the cell with flat interfaces is plotted for comparison.
Simulated absorption in the Ag contact in the solar cells with two combinations of the grating parameters and for the solar cell with flat interfaces.
Complex refractive indices ( is the refractive index, and is the extinction coefficient) for the layers used in the simulations.
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