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Performance characterization of microtomography with complementary metal-oxide-semiconductor detectors for computer-aided defect inspection
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10.1063/1.3124360
/content/aip/journal/jap/105/9/10.1063/1.3124360
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/9/10.1063/1.3124360
/content/aip/journal/jap/105/9/10.1063/1.3124360
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/content/aip/journal/jap/105/9/10.1063/1.3124360
2009-05-06
2014-10-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Performance characterization of microtomography with complementary metal-oxide-semiconductor detectors for computer-aided defect inspection
http://aip.metastore.ingenta.com/content/aip/journal/jap/105/9/10.1063/1.3124360
10.1063/1.3124360
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