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Real time characterization of hydrogenation mechanism of palladium thin films by in situ spectroscopic ellipsometry
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10.1063/1.3160307
/content/aip/journal/jap/106/1/10.1063/1.3160307
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/1/10.1063/1.3160307
/content/aip/journal/jap/106/1/10.1063/1.3160307
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/content/aip/journal/jap/106/1/10.1063/1.3160307
2009-07-09
2014-11-27
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Real time characterization of hydrogenation mechanism of palladium thin films by in situ spectroscopic ellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/jap/106/1/10.1063/1.3160307
10.1063/1.3160307
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