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Charge order, dielectric response, and local structure of system
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View: Figures


Image of FIG. 1.
FIG. 1.

2D image of the x-ray diffraction pattern of the crystal, recorded at by a CCD detector in a selected region of plane (a). The diffraction spots were indexed using a tetragonal unit cell ( space group) (, ). Temperature evolution of the charge order superstructure peak intensity (indicated by an arrow) is shown in panel (b), revealing order-disorderlike broad transition.

Image of FIG. 2.
FIG. 2.

Current-voltage phase shift (a) and modulus of complex dielectric impedance (b) of the sample, measured as a function of temperature at different frequencies. The dielectric permittivity at 1MHz are shown as an inset (panel b), along with the integrated intensity of the charge ordering superstructure [already shown in Fig. 1(b)].

Image of FIG. 3.
FIG. 3.

FTs of the EXAFS oscillations (shown as inset) measured on the system at 10 and 300 K, showing in-plane atomic distribution around the Ni atom. The FTs are performed between and using a Gaussian window and not corrected for the phase shifts, representing raw experimental data. The peaks 1.6 Å are due to in-plane Ni–O bonds, while the peak at 3.2 Å represents Ni–La(Sr) scatterings. The peak at 3.4 Å is due to the Ni–O–Ni multiple scattering. The first shell fit is also shown (dashed line).

Image of FIG. 4.
FIG. 4.

Temperature dependence of MSRD of the Ni–O pair determined by correlated DWFs , compared with the MSRD of Cu–O in . The dashed line is a fit and represents correlated Einstein model behavior with a temperature-independent (static) contribution. Data for (Ref. 30) are also shown.


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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Charge order, dielectric response, and local structure of La5/3Sr1/3NiO4 system